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A statistical analysis of the lifespan of electronic products subjected to high-voltage testing. The analysis includes individual measurements, moving ranges, and control limits for the lifespan data. The goal is to determine the expected lifespan of the products and identify any potential issues or variability in their performance. Detailed graphs and calculations to support the analysis, making it a valuable resource for engineers, quality control professionals, and researchers working on electronic product reliability and testing.
Typology: Exercises
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Rmedia 27.6 33. 1279.8 1266. 1132.8 1146. 90.3 86. 0.0 0. 2.7 1. 0.0 0. 3.3 2. n=2 n= LSCX LICX LSCR LICR E (^2) n = rango móvil utilizado, pu D^10 3 D (^4) Para entrar a tablas se ubica la intesección con la cons presentación dentro d
n = rango móvil utilizado, puede ser 2, 3, 4, 5 hasta 10 Para entrar a tablas se ubica el valor de n y se hace la intesección con la constante (la tabla en la presentación dentro del tema de I-RM)
Media de R LSCR LICR n=
Media de datos
Media de datos individuales LSCX LICX Medida individual 20 Media de R LSCR LICR n=
Media de datos individuales LSCX LICX Medida individual 2 14 16 18 20
Media de R LSCR LICR n=
Media de R LSCR LICR n=